Deep Learning based Performance Testing for Analog Integrated Circuits.

Jiawei Cao Chongtao Guo Hao Li Zhigang Wang Houjun Wang Geoffrey Ye Li

Published in: CoRR (2024)

Keyphrases

deep learning
integrated circuit
unsupervised learning
unsupervised feature learning
machine learning
signal processing
restricted boltzmann machine
weakly supervised
mental models
electron beam
image processing
multi class
object detection
deep architectures