Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies.
Sylvain ClercKedar Janardan DhoriRobin M. WilsonRohit GoelSébastien MarchalFranck PourchonChristian DuttoRicardo Gomez GomezPublished in: ESSCIRC (2021)
Keyphrases
- life cycle
- silicon on insulator
- cmos technology
- design process
- nm technology
- metal oxide semiconductor
- circuit design
- power dissipation
- low power
- product design
- concurrent engineering
- power consumption
- mass production
- high speed
- product development
- low cost
- ibm power processor
- chip design
- metamodel
- case study
- product life cycle
- business models
- parallel processing
- development life cycle
- requirements engineering
- delay insensitive
- power reduction
- digital circuits