Brain-Inspired Computing for Wafer Map Defect Pattern Classification.
Paul R. GensslerHussam AmrouchPublished in: ITC (2021)
Keyphrases
- pattern classification
- feature extraction
- nearest neighbor rule
- vowel recognition
- functional magnetic resonance imaging
- pattern recognition
- fuzzy classifier
- pattern classification problems
- human brain
- mass spectrometry data
- maximum a posteriori
- probabilistic neural network
- decision boundary
- conformal mapping
- parzen window
- radial basis function neural network
- signal processing
- neural network
- brain images
- integrated circuit
- pairwise
- discriminant embedding
- decision trees
- image processing