High-Sensitive Detection of Electronic Emission through Si-Nanocrystals/Si-Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy.
Daichi TakeuchiKatsunori MakiharaMitsuhisa IkedaSeiichi MiyazakiHirokazu KakiTsukasa HayashiPublished in: IEICE Trans. Electron. (2014)