A new line symmetry distance based pattern classifier.

Sriparna Saha Sanghamitra Bandyopadhyay Chingtham Tejbanta Singh

Published in: IJCNN (2008)

Keyphrases

distance measure
line segments
symmetry detection
curvilinear structures
data structure
outlier detection
learning algorithm
image processing
database systems
relational databases
special case
detection algorithm
line detection
principal axis