ESD test methods on integrated circuits: an overview.
Ming-Dou KerJeng-Jie PengHsin-Chin JiangPublished in: ICECS (2001)
Keyphrases
- integrated circuit
- preprocessing
- real time
- benchmark datasets
- empirical studies
- image processing
- significant improvement
- computational cost
- machine learning methods
- statistical methods
- optimal solution
- feature selection
- recommender systems
- learning algorithm
- neural network
- cross validation
- computationally expensive
- database