Special issue on depth image analysis.

Dmitry B. Goldgof Xiaoyi Jiang Olga Regina Pereira Bellon

Published in: Pattern Recognit. Lett. (2014)

Keyphrases

special issue
image analysis
international journal
ai edam
ecml pkdd
applied intelligence
pattern recognition
computer vision
special section
depth information
remote sensing
visual inspection
depth map
mathematical morphology
image segmentation
computer aided
scale space
knowledge discovery
databases