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Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of Process and Temperature Variations.

Ramin RajaeiMahmoud TabandehMahdi Fazeli
Published in: J. Circuits Syst. Comput. (2015)
Keyphrases
  • process model
  • power consumption
  • case study
  • design process
  • multiple targets