A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool.

Santosh Biswas Siddhartha Mukhopadhyay Amit Patra

Published in: Asian Test Symposium (2004)

Keyphrases

vlsi circuits
mixed signal
low power
multi channel
monitoring system
low cost
power consumption
real time
high speed
digital circuits
low voltage
image analysis
complex systems