Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design.

Chien-In Henry Chen Joel T. Yuen

Published in: IEEE Trans. Very Large Scale Integr. Syst. (1994)

Keyphrases

semi automated
built in self test
case study
computer aided
fully automated
automated design
database
artificial intelligence
engineering design
vlsi design
data sets
user interface
signal processing
design methodology
design space
single chip