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Realization of the Synchronization Mechanism of Step and Scan Projection Lithography.

Liangliang YangYunfei ZhouHaihong PanWei Teng
Published in: ICIRA (2) (2008)
Keyphrases
  • electron beam lithography
  • data sets
  • feature extraction
  • real world
  • expert systems
  • multi step
  • projection method