A fast and accurate characterization method for full-CMOS circuits.
Rafael Peset LlopisHans G. KerkhoffPublished in: EURO-DAC (1992)
Keyphrases
- high accuracy
- preprocessing
- high precision
- computationally efficient
- cost function
- significant improvement
- synthetic data
- similarity measure
- dynamic programming
- probabilistic model
- clustering method
- highly accurate
- data sets
- classification method
- optimization algorithm
- support vector machine svm
- input data
- image registration
- classification accuracy
- experimental evaluation
- prior knowledge