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Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations.
Gerald Esch Jr.
Tom Chen
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2004)
Keyphrases
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process model
high speed
low voltage
neural network
input output
power consumption
main memory
power supply
low cost
sensitivity analysis
parallel processing
low power
high voltage
electric arc furnace