Improving the OEE and UPH data quality by Automated Data Collection for the semiconductor assembly industry.
Tai-Yue WangHsiao-Chun PanPublished in: Expert Syst. Appl. (2011)
Keyphrases
- quality control
- data quality
- data collection
- quality management
- data warehouse
- data confidentiality
- information loss
- data preparation
- data transformation
- data cleaning
- data analysis
- case study
- data cleansing
- quality assessment
- sensor networks
- natural resources
- class noise
- cell suppression
- privacy preservation
- data privacy
- database systems
- data warehousing
- third party
- wireless sensor networks
- information systems
- real world
- databases