Multivariate process control for detection and cause identification of location shifts.
Amitava MitraMark M. ClarkPublished in: Int. J. Data Anal. Tech. Strateg. (2014)
Keyphrases
- process control
- control charts
- control system
- automatic identification
- manufacturing process
- semiconductor manufacturing
- intelligent control
- product quality
- automatic detection
- detection algorithm
- false positives
- detection rate
- detection method
- database
- location based services
- regression model
- detection accuracy
- object detection
- dynamic systems
- location information
- neural network
- data sets