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Analytical drain current model development of twin gate TFET in subthreshold and super threshold regions.
Pratikhya Raut
Umakanta Nanda
Deepak Kumar Panda
Published in:
Microelectron. J. (2023)
Keyphrases
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probabilistic model
mathematical model
management system
statistical model
experimental data
data sets
similarity measure
information processing
parameter estimation
computational model
conceptual model
parameter space
formal model
future development