Research on Surface Mounted IC Devices Inspection Based on Lead's Features.
Hui-hui WuSheng-lin LuPublished in: ICIRA (2) (2014)
Keyphrases
- co occurrence
- image features
- surface features
- geometrical features
- three dimensional
- feature space
- viewpoint
- mobile devices
- integrated circuit
- feature set
- classification accuracy
- geometric features
- intensity images
- video camera
- embedded systems
- shape from shading
- keypoints
- real time
- low level
- optical flow
- prior knowledge
- feature vectors
- feature extraction
- image segmentation
- decision trees