Mitigation of NBTI induced performance degradation in on-chip digital LDOs.

Longfei Wang S. Karen Khatamifard Ulya R. Karpuzcu Selçuk Köse

Published in: DATE (2018)

Keyphrases

circuit design
cmos image sensor
high speed
low cost
phase locked loop
mixed signal
digital curves
single chip
high density
real time
database
programmable logic
digital technologies
digital content
risk management
vlsi design
digital images
analog vlsi
data sets