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Key Generation Using External Source Excitation: Capacity, Reliability, and Secrecy Exponent.
Tzu-Han Chou
Stark C. Draper
Akbar M. Sayeed
Published in:
IEEE Trans. Inf. Theory (2012)
Keyphrases
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reliability analysis
data sets
power law
internal and external
key management
highly reliable
high capacity
data mining
information systems
decision trees
sensor networks
spread spectrum
software reliability