Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring.

P. N. Bajeel M. Kumar

Published in: ICMC (2020)

Keyphrases

type ii
optimal design
dynamic programming
maximum likelihood
bayesian networks
design process
statistical tests
experimental design
case study
lower bound
active learning
probability distribution
regression model
computer architecture
bayesian decision