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A novel TSV probing technique with adhesive test interposer.

Li JiangXiangwei HuangHongfeng XieQiang XuChao LiXiaoyao LiangHuiyun Li
Published in: ICCD (2015)
Keyphrases
  • data sets
  • real time
  • real world
  • learning algorithm
  • high level
  • data structure
  • user interface
  • statistical tests