An Experimental Study on Latch Up Failure of CMOS LSI.

Hideo Kohinata Masayuki Arai Satoshi Fukumoto

Published in: SSIRI (2008)

Keyphrases

power consumption
low power
latent semantic indexing
high speed
low cost
image processing
vlsi circuits
analog vlsi
high density
circuit design
real time
image sensor
cmos technology
failure detection
failure prediction
single chip
root cause
focal plane
success or failure
power reduction