A new intelligent SOFM-based sampling plan for advanced process control.
Jang Hee LeeSung Jin YouSang-Chan ParkPublished in: Expert Syst. Appl. (2001)
Keyphrases
- process control
- intelligent control
- control system
- product quality
- random sampling
- manufacturing process
- plan recognition
- intelligent systems
- semiconductor manufacturing
- sample size
- color quantization
- sampling algorithm
- self organizing maps
- monte carlo
- ai planning
- decision support
- artificial intelligence
- decision theoretic
- agent technology
- sampling strategy
- plan generation
- web enabled