Login / Signup
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications.
Ambika Prasad Shah
Santosh Kumar Vishvakarma
Michael Hübner
Published in:
J. Electron. Test. (2020)
Keyphrases
</>
power consumption
error rate
machine learning
linear complexity
error free
genetic algorithm
error bounds
prediction error
error analysis
error propagation
living cells