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AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis.

M. DoulcierMarie-Lise FlottesBruno Rouzeyre
Published in: DELTA (2008)
Keyphrases
  • statistical analysis
  • data analysis
  • data sets
  • databases
  • real world
  • clustering algorithm
  • decision trees
  • artificial neural networks
  • image analysis