WDP-BNN: Efficient wafer defect pattern classification via binarized neural network.
Qing ZhangYuhang ZhangJizuo LiYongfu LiPublished in: Integr. (2022)
Keyphrases
- pattern classification
- neural network
- pattern recognition
- probabilistic neural network
- pattern classification problems
- fuzzy classifier
- feature extraction
- radial basis function neural network
- mass spectrometry data
- artificial neural networks
- nearest neighbor rule
- vowel recognition
- parzen window
- rbf network
- fuzzy classification
- human identification
- bp neural network
- self organizing maps
- back propagation
- multiscale
- image processing
- computer vision