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Remaining useful lifetime prediction of thermally aged power insulated gate bipolar transistor based on Gaussian process regression.
Adla Ismail
Lotfi Saidi
Mounir Sayadi
Mohamed Benbouzid
Published in:
Trans. Inst. Meas. Control (2020)
Keyphrases
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field effect transistors
gaussian process regression
steady state
high density
mathematical analysis
gaussian processes
gaussian process
covariance function
power consumption
high speed
low power
power dissipation
face recognition
markov chain
non stationary
incremental learning