Defect count prediction via metric-based convolutional neural network.

Meetesh Nevendra Pradeep Singh

Published in: Neural Comput. Appl. (2021)

Keyphrases

convolutional neural network
prediction accuracy
face detection
prediction model
distance measure
real time
learning algorithm
prediction algorithm
database
databases
information systems
metric space
metric learning
artificial neural networks
query processing
dimensionality reduction