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Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.
Darsun Tsiena
Chien Kuo Wang
William W. J. Wang
Yajun Ran
Philippe Hurat
Nishath Verghese
Published in:
SoCC (2007)
Keyphrases
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context specific
general purpose
genetic algorithm
data analysis
trade off
database
data sets
three dimensional
digital libraries
image analysis
quantitative analysis