A novel intelligent approach to anchorage measurement using electron microscopy.

Karol Warne Girijesh Prasad Nazmul H. Siddique Liam P. Maguire

Published in: SMC (2003)

Keyphrases

electron microscopy
low energy
x ray
image stacks
thin film
decision support
microscopy images
intelligent systems
data acquisition
high level
expert systems
computational intelligence
low cost
tubular structures