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Power and Thermal Fault Effect Exploration Framework for Reader/Smart Card Designs.

Norbert DrumlManuel MenghinTobias RauterChristian StegerReinhold WeissChristian BachmannHolger BockJosef Haid
Published in: DSD (2013)
Keyphrases
  • smart card
  • neural network
  • fault diagnosis
  • software architecture
  • security requirements
  • secret key
  • security analysis