An Efficient Functional Test for the Massively-Parallel C ?RAM Logic-Enhanced Memory Architecture.
Xiaoling SunBruce F. CockburnDuncan G. ElliottPublished in: DFT (2003)
Keyphrases
- massively parallel
- processing elements
- random access memory
- design considerations
- memory access
- parallel computing
- fine grained
- parallel computers
- high performance computing
- data access
- multithreading
- parallel architectures
- main memory
- embedded dram
- memory management
- hardware architecture
- parallel processors
- random access
- hardware implementation
- mesh connected
- associative memory
- flash memory
- parallel machines