Login / Signup

Reliability Analysis of High Gain Integrated DC-DC Topologies for Xenon Lamp Applications.

Divya NavamaniK. VijayakumarJason Manoraj
Published in: J. Circuits Syst. Comput. (2019)
Keyphrases
  • reliability analysis
  • neural network
  • databases
  • machine learning
  • expert systems
  • relational databases
  • knowledge discovery
  • management system
  • text mining
  • rough sets
  • genetic programming
  • evolutionary computation