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A simple method for evaluating the transient thermal response of semiconductor devices.

Noel Y. A. ShammasM. P. RodriguezF. Masana
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • semiconductor devices
  • electron beam
  • infrared
  • steady state
  • field effect transistors
  • real time
  • neural network
  • power plant