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Analyzing the Single Event Upset Vulnerability of Binarized Neural Networks on SRAM FPGAs.
Ioanna Souvatzoglou
Athanasios Papadimitriou
Aitzan Sari
Vasileios Vlagkoulis
Mihalis Psarakis
Published in:
DFT (2021)
Keyphrases
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neural network
pattern recognition
event driven
artificial neural networks
real time
power consumption
event detection
neural network model
computer vision
image processing
face recognition
fault diagnosis
multi layer perceptron