Analysis of charge-to-hot-carrier degradation in Ge pFinFETs.

Wataru Mizubayashi Hiroshi Oka Koichi Fukuda Yuki Ishikawa Kazuhiko Endo

Published in: IRPS (2020)

Keyphrases

statistical analysis
real time
data analysis
image processing
case study
multiscale
digital libraries
trade off
image analysis
medical images