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Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method.
Miao Cai
Dao-Guo Yang
Kunmiao Tian
Ping Zhang
Xianping Chen
Lilin Liu
Guoqi Zhang
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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computational complexity
feature vectors
high resolution
high power