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Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method.

Miao CaiDao-Guo YangKunmiao TianPing ZhangXianping ChenLilin LiuGuoqi Zhang
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • computational complexity
  • feature vectors
  • high resolution
  • high power