Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes.
Narayanaswamy BalakrishnanElena CastillaMaría JaenadaLeandro PardoPublished in: Qual. Reliab. Eng. Int. (2023)
Keyphrases
- probabilistic model
- neural network
- artificial neural networks
- formal model
- video sequences
- control system
- management system
- theoretical analysis
- computational model
- process model
- conceptual model
- experimental data
- robust optimization
- bayesian model
- prediction model
- prior information
- test data
- statistical model
- theoretical framework
- parameter estimation
- similarity measure
- face recognition
- decision trees