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An accurate analytical I-V model for sub-90-nm MOSFETs and its application to read static noise margin modeling.
Behrouz Afzal
Behzad Ebrahimi
Ali Afzali-Kusha
Massoud Pedram
Published in:
J. Zhejiang Univ. Sci. C (2012)
Keyphrases
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modeling method
conceptual model
mathematical model
modeling framework
experimental data
neural network model
high level
training data
objective function
probabilistic model
management system
input data
neural network
training set
statistical model