A New Placement Algorithm for Reduction of Soft Errors in Macrocell Based Design of Nanometer Circuits.
Koustav BhattacharyaNagarajan RanganathanPublished in: ISVLSI (2009)
Keyphrases
- learning algorithm
- detection algorithm
- optimization algorithm
- high accuracy
- matching algorithm
- computational complexity
- preprocessing
- worst case
- recognition algorithm
- clustering method
- expectation maximization
- user interface
- computational cost
- data sets
- experimental evaluation
- dynamic programming
- cost function
- search space
- tree structure
- convergence rate
- similarity measure
- data reduction
- simulated annealing
- objective function
- selection algorithm