LPScan: An algorithm for supply scaling and switching activity minimization during test.
Seetal PotluriSatya Trinadh AdireddyChidhambaranathan RajamanikkamShankar BalachandranPublished in: ICCD (2013)
Keyphrases
- objective function
- learning algorithm
- improved algorithm
- detection algorithm
- theoretical analysis
- search space
- k means
- significant improvement
- dynamic programming
- experimental evaluation
- expectation maximization
- high accuracy
- estimation algorithm
- times faster
- classification algorithm
- segmentation algorithm
- probabilistic model
- computational cost
- cost function
- preprocessing
- computational complexity
- optimal solution
- input data
- scheduling problem
- energy function
- matching algorithm
- convex hull
- selection algorithm
- video sequences