Login / Signup

Synthesis for parallel scan: applications to partial scan and robust path-delay fault testability.

Sandeep BhatiaNiraj K. Jha
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
  • scan data
  • computationally efficient
  • shortest path
  • fault detection
  • parallel implementation
  • search algorithm
  • partial occlusion
  • program synthesis