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Robustness of Quantum Federated Learning (QFL) Against "Label Flipping Attacks" for Lithography Hotspot Detection in Semiconductor Manufacturing.
Amandeep Singh Bhatia
Sabre Kais
Muhammad Ashraful Alam
Published in:
IRPS (2024)
Keyphrases
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semiconductor manufacturing
learning algorithm
active learning
detection method
learning systems
learning tasks
learning process
object detection
unsupervised learning
e learning
reinforcement learning
prior knowledge
supervised learning
digital image watermarking