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A Distance-Based Technique for Non-Manhattan Layout Analysis.

Stefano FerilliMarenglen BibaFloriana EspositoTeresa Maria Altomare Basile
Published in: ICDAR (2009)
Keyphrases
  • outlier detection
  • distance measure
  • pattern recognition
  • query processing
  • data mining
  • machine learning
  • genetic algorithm
  • computer vision
  • reinforcement learning