An Electromechanical Model and Simulation for Test Process of the Wafer Probe.
Junhui LiHailong LiaoDasong GeCan ZhouChengdi XiaoQing TianWenhui ZhuPublished in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
- simulation model
- formal model
- mathematical model
- optimization process
- conceptual model
- prior knowledge
- process model
- agent model
- theoretical framework
- statistical model
- simulation study
- analytical model
- generation process
- simulation environment
- neural network model
- simulation data
- poisson process
- agent based modeling
- massively parallel
- high level
- test data
- experimental data
- evolutionary algorithm
- expert systems