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Reordering-Based Test Pattern Reduction Considering Critical Area-Aware Weighted Fault Coverage.
Masayuki Arai
Kazuhiko Iwasaki
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2017)
Keyphrases
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pattern matching
artificial intelligence
pattern discovery
computer vision
database systems
image sequences
search algorithm
reduction method