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Circuit Failure Prediction and Its Application to Transistor Aging.
Mridul Agarwal
Bipul C. Paul
Ming Zhang
Subhasish Mitra
Published in:
VTS (2007)
Keyphrases
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failure prediction
high speed
circuit design
power dissipation
equivalent circuit
low power
civil engineering
power consumption
digital circuits
metal oxide semiconductor
image processing
cmos technology
electronic circuits
age related
software aging
biologically inspired
steady state