Circuit Failure Prediction and Its Application to Transistor Aging.

Mridul Agarwal Bipul C. Paul Ming Zhang Subhasish Mitra

Published in: VTS (2007)

Keyphrases

failure prediction
high speed
circuit design
power dissipation
equivalent circuit
low power
civil engineering
power consumption
digital circuits
metal oxide semiconductor
image processing
cmos technology
electronic circuits
age related
software aging
biologically inspired
steady state