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Fault masking issue on a dependable processor using BIST under highly electromagnetic environment.
Aromhack Saysanasongkham
Satoshi Fukumoto
Masayuki Arai
Published in:
Int. J. Comput. Sci. Eng. (2017)
Keyphrases
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real time
mobile robot
dynamic environments
fault diagnosis
parallel processing
knowledge base
high speed
data sets
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natural images
high frequency
complex environments
programming environment
instruction set