Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits.

Kunihiro Oshima Kazunori Kuribara Takashi Sato

Published in: ASPDAC (2024)

Keyphrases

case study
building blocks
real time
genetic algorithm
engineering design
circuit design
artificial intelligence
learning environment
high speed
collaborative learning
design decisions
design considerations
digital circuits