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Determining the Average Grain Size of Super-Alloy Micrographs.

Wanda BenesovaAlfred RinnhoferGerhard Jakob
Published in: ICIP (2006)
Keyphrases
  • grain size
  • spatial distribution
  • thin film
  • standard deviation
  • real time
  • information systems
  • decision trees
  • multiscale
  • feed forward
  • mechanical properties